Photograph Deterioration / life continuous monitoring test
OKI launches "deterioration / life continuous monitoring test service" for EV power semiconductors
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The new service combines a high-temperature reverse bias test with a proprietary "fully automatic log system" that connects a data logger, test circuit board, and failure detection device (leakage current measuring device) to ensure the progress of deterioration and failure occurrence for each individual. Enables monitoring.
On July 7, OKI Engineering (OEG) announced that it would monitor power semiconductors for EVs with continuous deterioration and longevity. → Continue reading
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